Toggle navigation
Nanoscience Center
Info
Register
Log in
Search
Change language: FI
EN
FI
Front page
Microscopy
Nanoscopy
Spectroscopy
Nanoscience Center
Microscopy
Bruker Dimension Icon
Bruker Dimension Icon
Key facts
Status
Available
Location
YN040.2
Is resource specific training required?
Yes
Administrator contact info
Name
Email
Phone
Kimmo Kinnunen
kimmo.m.kinnunen@jyu.fi
+358408054790
Heini Järvinen
heini.j.jarvinen@jyu.fi
Resource information
Manufacturer
Bruker
Model
Dimension Icon
Properties
X-Y scan range (typical): 90 μm x 90 μm, Z-range (typical): 10 μm
Sample size/holder: 210mm vacuum chuck for samples, ≤210mm diameter, ≤15mm thick
High-pixel-density images: 5120 x 5120
Vertical noise: < 35 pm
Closed loop operation
Integral non-linearity usually < 0,5 %
Drift rates less than 200 pm per minute render distortion-free images immediately.
Temperature-compensating position sensors.
NanoScope V controller.
Image(s)
Host unit
Nanotiedekeskus
Tags
AFM
atomivoimamikroskooppi
atomic force microscope
NSC
nano
Organization
Concise description
Atomic Force Microscope
×
Research Infrastructure Booking System
Please select an infrastructure:
Front page
Department of Biological and Environmental Science
Digital Services
Department of Physics
Department of History and Ethnology
School of Business and Economics
Department of Chemistry
Department of Language and Communication Studies
Laboratory Center
Faculty of Sport and Health Sciences
Department of Music, Art and Culture Studies
Nanoscience Center
Department of Psychology
Ruusupuisto
Centre for Applied Language Studies
Department of Social Sciences and Philosophy